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SJ 20938-2005Microwave circuits. Measuring methods for frequency converters (English PDF)

微波电路变频测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Mandatory

Issue date

January 18, 2006

Implementation date

June 1, 2006

Scope

SJ 20938-2005 is the English-translated version of 微波电路变频测试方法.

SJ 20938-2005 is the Chinese standard "Microwave circuits. Measuring methods for frequency converters". This standard specifies the microwave circuit upconverter, down converter electrical parameters of the test method. Issued on 2006-01-18, in force from 2006-06-01.

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Document preview — SJ 20938-2005

National Standard of the People's Republic of China

ICS: 31.080.01
Classification: L55

[Preview only]
1 Scope
2 Normative References
2.1 Terms
3 Terms and Definitions
4 Overview
4.1 General requirements
5 Technical Requirements
6 Calibration conditions
6.1 Environmental conditions
6.2 Measurement standards and other equipment
7 Calibration items and calibration methods
7.1 Calibration Items
7.2 Calibration method
8 Expression of calibration results
9 Recalibration interval

1 Foreword

SJ 20938-2005 was issued by Ministry of Industry and Information Technology on 18 January 2006 and has been in force since 1 June 2006.

The SJ prefix, without a suffix, marks a mandatory standard: within its scope, compliance is required.

The document runs to 17 pages in English translation.

2 Scope Preview

This standard specifies the microwave circuit upconverter, down converter electrical parameters of the test method.

SJ 20938-2005 falls under ICS 31.080.01, in the field of electronics.

This catalogue holds 133 other SJ standards in that field.

In this catalogue, SJ standards carry edition years from 1965 to 2021.

3 About this standard

Sector: Electronics Industry Standard

Issued by: Ministry of Industry and Information Technology

English translation: about 17 pages (approximate)

Chinese original: about 25,284 characters

4 Related standards

Standards on related subjects:

GB/T 46280.2-2025 — Specification for chiplet interconnection interface — Part 2: Protocol layer technical requirements

SJ/T 11891-2023 — Energy efficiency measurement method for LED displays

GB/T 35010.6-2018 — Semiconductor die products -- Part 6: Requirements for concerning thermal simulation

SJ 21473.7-2021 — Methods of measuring electromagnetic immunity of military integrated circuits - Part 7: Measurement of pulse immunity - non-synchronous transient injection method

SJ 21473.6-2021 — Methods of measuring electromagnetic immunity of military integrated circuits - Part 6: Impulse immunity measurement - Synchronous transient injection method

5 Classification and status

International classification (ICS): 31.080.01

Chinese Standard Classification (CCS): L 55

Prefix SJ: mandatory standard.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.

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