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SJ 20868-2003Measuring methods for charge coupled imaging device (English PDF)

电荷耦合成像器件测试方法

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Issued by

Ministry of Industry and Information Technology of PRC

Level / Type

National · Mandatory

Issue date

December 15, 2003

Implementation date

March 1, 2004

Scope

SJ 20868-2003 is the English-translated version of 电荷耦合成像器件测试方法.

SJ 20868-2003 — This standard specifies the spectral range of 350nm ~ 1100nm linear array and area array CCD imaging device parameter testing methods.

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Document preview — SJ 20868-2003

National Standard of the People's Republic of China

ICS: 31.260
Classification: L 50

What this standard covers1
Document data2

What this standard covers

This standard specifies the spectral range of 350nm ~ 1100nm linear array and area array CCD imaging device parameter testing methods.

Document data

International classification (ICS): 31.260.

Chinese classification (CCS): L50.

Estimated length of the Chinese original: 24,286 words.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 16 pages — is available in the English PDF.

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