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SJ 20844-2002Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide (English PDF)

决绝缘砷化镓单晶微区均匀性测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Mandatory

Issue date

October 30, 2002

Implementation date

March 1, 2003

Scope

SJ 20844-2002 is the English-translated version of 决绝缘砷化镓单晶微区均匀性测试方法.

SJ 20844-2002 is the Chinese standard "Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide". This standard specifies the semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and uniformity of micro- PL spectra measurement method.

This standard applies to semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and micro- PL spectra Determination of uniformity. Issued on 2002-10-30, in force from 2003-03-01.

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Document preview — SJ 20844-2002

National Standard of the People's Republic of China

Classification: H83;L90

[Preview only]
1 Scope
2 Normative References
2.1 Terms
3 Terms and Definitions
4 Overview
4.1 General requirements
5 Technical Requirements
6 Calibration conditions
6.1 Environmental conditions
6.2 Measurement standards and other equipment
7 Calibration items and calibration methods
7.1 Calibration Items
7.2 Calibration method
8 Expression of calibration results
9 Recalibration interval

1 Foreword

SJ 20844-2002 was issued by Ministry of Industry and Information Technology on 30 October 2002 and has been in force since 1 March 2003.

The SJ prefix, without a suffix, marks a mandatory standard: within its scope, compliance is required.

The document runs to 9 pages in English translation.

2 Scope Preview

This standard specifies the semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and uniformity of micro- PL spectra measurement method. This standard applies to semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and micro- PL spectra Determination of uniformity.

SJ 20844-2002 is filed under Chinese Standard Classification H83;L90, in the field of metallurgy.

This catalogue holds 1,191 other SJ standards without an ICS number.

In this catalogue, SJ standards carry edition years from 1965 to 2021.

3 About this standard

Sector: Electronics Industry Standard

Issued by: Ministry of Industry and Information Technology

English translation: about 9 pages (approximate)

Chinese original: about 13,117 characters

4 Related standards

Standards on related subjects:

GB/T 25074-2017 — Solar-grade polycrystalline silicon

SJ/T 11488-2015 — Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals

YS/T 13-2015 — High pure germanium tetrachloride

SJ 21589-2021 — Indium Phosphide Ingot Rolling Technology Requirements

SJ 21588-2021 — Indium Phosphide Crystal Ingot Cutting and Orientation Technology Requirements

5 Classification and status

Chinese Standard Classification (CCS): H 83; L 90

Prefix SJ: mandatory standard.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 9 pages — is available in the English PDF.

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