SJ 20831-2002Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly (English PDF)
4N红钱焦平面探测器杜瓦组件参数测试方法
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Issued by
Ministry of Industry and Information Technology of PRC
Level / Type
National · Mandatory
Issue date
October 30, 2002
Implementation date
March 1, 2003
Scope
SJ 20831-2002 is the English-translated version of 4N红钱焦平面探测器杜瓦组件参数测试方法.
SJ 20831-2002 — This standard specifies the 4N infrared focal plane detector dewar assembly (hereinafter referred to as 4N components) parameter definitions, test methods and general test conditions.
4N 4N component consists of infrared focal plane array detectors and Dewar composition. 4N infrared focal plane detector is with four time delay integration (TDI) circuit infrared focal plane detector. The total number of pixels 4N months, a total of N- channel electricity.
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Document preview — SJ 20831-2002
National Standard of the People's Republic of China
- Classification
- L 52
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the 4N infrared focal plane detector dewar assembly (hereinafter referred to as 4N components) parameter definitions, test methods and general test conditions. 4N 4N component consists of infrared focal plane array detectors and Dewar composition. 4N infrared focal plane detector is with four time delay integration (TDI) circuit infrared focal plane detector. The total number of pixels 4N months, a total of N- channel electricity. This standard applies to 4N component testing.
Document data
Chinese classification (CCS): L52.
Estimated length of the Chinese original: 12,122 words.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 8 pages — is available in the English PDF.
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