SJ 20788-2000Measurment method for thermal impedance of semiconductor diodes (English PDF)
半导体二极管热阻抗测试方法
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Issued by
Ministry of Industry and Information Technology of PRC
Level / Type
National · Mandatory
Issue date
October 20, 2000
Implementation date
October 20, 2000
Scope
SJ 20788-2000 is the English-translated version of 半导体二极管热阻抗测试方法.
SJ 20788-2000 — This standard specifies the steady-state thermal resistance and semiconductor diode transient thermal impedance testing methods.
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Document preview — SJ 20788-2000
National Standard of the People's Republic of China
- Classification
- L 41
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the steady-state thermal resistance and semiconductor diode transient thermal impedance testing methods. This standard applies to rectifier diodes, transient voltage suppression diodes, zener diode and some power zener, signaling and switching diodes steady state and transient thermal resistance obstruction tests.
Document data
Chinese classification (CCS): L41.
Estimated length of the Chinese original: 14,170 words.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 9 pages — is available in the English PDF.
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SJ 20788-2000
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