JJF 1015-2014General Norm for Pattern Evaluation of Measuring Instruments (English PDF)

Foreword

JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring

Instruments" is a guiding technical specification for pattern evaluation of

measuring instruments.

JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring

Instruments" was modified on the basis of JJF 1015-2002 "General Norm for

Pattern Evaluation and Pattern Approval of Measuring Instruments", which

references to partial contents of No.19 "Pattern evaluation and pattern

approval" of International Organization for Legal Metrology (OIML) and

combines with the relevant requirements proposed by the metrological

administrative department.

Compared with JJF 1015-2002, this Norm is only related to the pattern

evaluation of the measuring instruments. The pattern approval shall be

specified by relevant documents issued by the metrological administrative

department. The main changes of this revision are as follows.

- Add terms "single product" and "series product" (see 3.3 and 3.4);

- Add "Application for Pattern Approval of Measuring Instruments that was

accepted and entrusted by the government metrological administrative

department" in the submitted technical information (see 4.1);

- Make significant change in the submitted test prototype (see 4.2);

- Improve the approved pattern or specify the basis-change of the previous

pattern evaluation (see 5.1);

- Refine the examination of technical information to make it more operatable

(see 5.2);

- Divide the pattern evaluation into observation project and test project, so

as easy for description (see 5.3 and 5.4);

- Add "function verification" (see 5.4.1);

- Refine "stability test" (see 5.4.7);

- Change the way of "determination of pattern evaluation result"; it shall be

determined as qualified only when all the items for evaluation are qualified

(see 5.5);

- Enrich the "pattern evaluation report" by requiring records and photos to be

listed in the report as attachment (see 5.6);

- Change the handling of test prototype (see 6);

- Refine the "notices" of "pattern evaluation report" and specify 15-day

appeal period (see Appendix A);

- Add tables of "measurement parameters for measuring instruments",

"critical parts and materials", "list of equipment for pattern evaluation" and

"list of evaluation items and evaluation results";

- Delete contents relating to pattern approval;

- Delete basic safety test;

- Delete tests for adaptability of measuring performance in transport

simulation and retention simulation;

- Delete "handling for the first test failure".

The previous versions of this Norm are.

- JJF 1015-2002;

- JJF 1015-1990.

General Norm for Pattern Evaluation

of Measuring Instruments

1 Scope

This Norm is applicable to pattern evaluation of measuring instruments and

approved pattern's compliance examination.

2 Normative references

This Norm takes the following documents as reference.

JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of

Measuring Instruments;

JJF 1051 Designation and Classification Code for Measuring Instruments;

JJF 1069 Rules for the Examination of the Service of Legal Metrological

Verification.

For dated references, only the edition cited applies. For undated references,

the latest edition of the referenced document (including any amendments)

applies.

3 Terms and definitions

Terms and definitions defined by JJF 1001 "General Terms in Metrology and

Their Definitions" AND the following terms and definitions are applicable to this

Norm.

4 Technical information and test prototype that shall

be submitted by the application organization

The applicant shall provide the technical information and test prototype required

by pattern evaluation to the technical agency who undertakes the pattern

evaluation.

5 Pattern evaluation

6 Handling of test prototype

7 Handling of technical information

After the pattern evaluation is completed (qualified or unqualified), the technical

information submitted by the applicant shall be handled in the following ways.

JJF 1015-2014

NATIONAL METROLOGY TECHNICAL SPECIFICATION

OF THE PEOPLE'S REPUBLIC OF CHINA

Replacing JJF 1015-2002

General Norm for Pattern Evaluation of

Measuring Instruments

Issued on. JANUARY 23, 2014

Implemented on. JULY 23, 2014

Issued by. General Administration of Quality Supervision, Inspection and

Quarantine

General Norm for Pattern Evaluation

of Measuring Instruments

Replacing JJF 1015-2002

Jurisdiction organization. National Technical Committee of Legal Metrology

Metering Management

Drafting organizations. Beijing Institute of Metrology Detection

Beijing Bureau of Quality and Technical Supervision

China National Institute of Metrology

This Norm is entrusted to National Technical Committee of Legal Metrology

Metering Management for the interpretation.

Drafters of this Norm.

Wang, Zigang (Beijing Institute of Metrology Detection)

Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision)

He, Zhao (China National Institute of Metrology).

Table of Contents

Foreword... 5

1 Scope... 7

2 Normative references... 7

3 Terms and definitions... 7

4 Technical information and test prototype that shall be submitted by the

application organization... 8

5 Pattern evaluation... 9

6 Handling of test prototype... 12

7 Handling of technical information... 13

Annex A Pattern Evaluation Report Format... 14

Annex B Format for "Explanation" on Prototype Retention of Pattern Evaluation

... 19

Foreword

JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring

Instruments" is a guiding technical specification for pattern evaluation of

measuring instruments.

JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring

Instruments" was modified on the basis of JJF 1015-2002 "General Norm for

Pattern Evaluation and Pattern Approval of Measuring Instruments", which

references to partial contents of No.19 "Pattern evaluation and pattern

approval" of International Organization for Legal Metrology (OIML) and

combines with the relevant requirements proposed by the metrological

administrative department.

Compared with JJF 1015-2002, this Norm is only related to the pattern

evaluation of the measuring instruments. The pattern approval shall be

specified by relevant documents issued by the metrological administrative

department. The main changes of this revision are as follows.

- Add terms "single product" and "series product" (see 3.3 and 3.4);

- Add "Application for Pattern Approval of Measuring Instruments that was

accepted and entrusted by the government metrological administrative

department" in the submitted technical information (see 4.1);

- Make significant change in the submitted test prototype (see 4.2);

- Improve the approved pattern or specify the basis-change of the previous

pattern evaluation (see 5.1);

- Refine the examination of technical information to make it more operatable

(see 5.2);

- Divide the pattern evaluation into observation project and test project, so

as easy for description (see 5.3 and 5.4);

- Add "function verification" (see 5.4.1);

- Refine "stability test" (see 5.4.7);

- Change the way of "determination of pattern evaluation result"; it shall be

determined as qualified only when all the items for evaluation are qualified

(see 5.5);

- Enrich the "pattern evaluation report" by requiring records and photos to be

listed in the report as attachment (see 5.6);

- Change the handling of test prototype (see 6);

- Refine the "notices" of "pattern evaluation report" and specify 15-day

appeal period (see Appendix A);

- Add tables of "measurement parameters for measuring instruments",

"critical parts and materials", "list of equipment for pattern evaluation" and

"list of evaluation items and evaluation results";

- Delete contents relating to pattern approval;

- Delete basic safety test;

- Delete tests for adaptability of measuring performance in transport

simulation and retention simulation;

- Delete "handling for the first test failure".

The previous versions of this Norm are.

- JJF 1015-2002;

- JJF 1015-1990.

General Norm for Pattern Evaluation

of Measuring Instruments

1 Scope

This Norm is applicable to pattern evaluation of measuring instruments and

approved pattern's compliance examination.

2 Normative references

This Norm takes the following documents as reference.

JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of

Measuring Instruments;

JJF 1051 Designation and Classification Code for Measuring Instruments;

JJF 1069 Rules for the Examination of the Service of Legal Metrological

Verification.

For dated references, only the edition cited applies. For undated references,

the latest edition of the referenced document (including any amendments)

applies.

3 Terms and definitions

Terms and definitions defined by JJF 1001 "General Terms in Metrology and

Their Definitions" AND the following terms and definitions are applicable to this

Norm.

4 Technical information and test prototype that shall

be submitted by the application organization

The applicant shall provide the technical information and test prototype required

by pattern evaluation to the technical agency who undertakes the pattern

evaluation.

5 Pattern evaluation

6 Handling of test prototype

7 Handling of technical information

After the pattern evaluation is completed (qualified or unqualified), the technical

information submitted by the applicant shall be handled in the following ways.

......