GB/T 42242-2022Space environment - Evaluation of radiation effects on Commercial-Off-The-Shelf (COTS) parts for use on low-orbit satellite (English PDF)

National Standard of the People's Republic of China

ICS

19.040

Classification

V 06

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

• Preface
• Introduction
• 1 Scope
• 2 Normative references
• 3 Terms and Definitions
• 4 Abbreviations
• 5 Radiation resistant design
• 5.1 Overview
• 5.2 Basic idea of using COTS devices
• 5.2.1 Device Selection
• 5.2.2 Evaluation of COTS devices
• 5.2.3 Methods of assessment
• 5.2.4 Application concept of COTS device/consumer technology
• 5.3 Prediction of space radiation environment
• 5.3.1 Space environment
• 5.3.2 Space radiation environment model
• 5.3.3 Input parameters
• 5.3.4 Environmental conditions required for assessment
• 6 Radiation tolerance test
• 6.1 Types of irradiation tests
• 6.1.1 Cobalt 60 (gamma ray) irradiation test
• 6.1.2 Proton irradiation test
• 6.1.3 Heavy ion irradiation test
• 6.1.4 Laser pulse irradiation test
• 6.2 Radiation sensitive devices
• 6.2.1 Ionizing total dose sensitive device
• 6.2.2 Single Event Effect Sensitive Devices
• 6.2.3 Displacement damage sensitive devices
• 6.3 Test procedure
• 6.3.1 Total ionization dose test
• 6.3.2 Single Event Event Test
• 6.3.3 Displacement damage test
• 6.3.4 Laser pulse test for SEE test
• 7 Recommendations for assessment of radiation effects
• Appendix A (Informative) Structure Number Comparison List
• Appendix B (informative) Technical differences between this document and ISO 21980.2020 and their reasons
• Appendix C (Informative) Radiation Resistance Design Procedure
• Appendix D (informative) total dose prediction method
• Appendix E (informative) Radiation method using contour plots to plot total dose
• Appendix F (informative) Comparison example between model predictions and measurements
• Appendix G (Informative) Radiation Degradation of Electronic Components
• Appendix H (Informative) Overview of Single Event Effects
• Appendix I (Informative) Countermeasures for Single Event Events of Electronic Components
• Appendix J (informative) Countermeasures for device single event events
• Appendix K (informative) Prediction method of displacement damage
• Appendix L (informative) Displacement damage tolerance of each device
• Appendix M (Informative) Guidelines for Displacement Damage Tests of Semiconductor Devices
• Appendix N (Informative) Laser Pulse Irradiation Test Method