GB/T 22319.7-2015Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units (English PDF)
石英晶体元件参数的测量 第7部分:石英晶体元件活性跳变的测量
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Issued by
Standardization Administration of China
Level / Type
National · Recommended
Issue date
June 2, 2015
Implementation date
February 1, 2016
Scope
GB/T 22319.7-2015 is the English-translated version of 石英晶体元件参数的测量 第7部分:石英晶体元件活性跳变的测量.
GB/T 22319.7-2015 — This section GB/T 22319 specifies the methods of measurement in the temperature range of quartz crystal element active hopping.
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Document preview — GB/T 22319.7-2015
National Standard of the People's Republic of China
- ICS
- 31.140
- Classification
- L 21
Issued by: Standardization Administration of China
Contents
- What this standard covers1
- Document data2
What this standard covers
This Standard specifies the measuring method in the temperature range of quartz crystal element active hopping.
Document data
International classification (ICS): 31.140.
Chinese classification (CCS): L21.
Estimated length of the Chinese original: 7,712 words.
Adopted international standard: IEC 60444-7-2004, IDT.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 5 pages — is available in the English PDF.
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Related Standards
GB/T 22319.11-2018 — Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
GB/T 22319.6-2023 — Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
GB/T 22319.8-2025 — Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
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