GB/T 20111.5-2020Electrical insulation systems--Procedures for thermal evaluation - Part 5: Applications with a designed life of 5 000 h or less (English PDF)

Foreword

GB/T 20111 "Regulations for Thermal Evaluation of Electrical Insulation Systems" is divided into the following parts.

---Part 1.General requirements for low pressure;

---Part 2.Special requirements for general model applications for random winding;

---Part 3.Special requirements for encapsulated coil models, random winding electrical insulation system (EIS);

---Part 4.Guidelines for the selection of test methods for evaluation and classification of electrical insulation systems;

---Part 5.Applications with a design life of 5000h and below.

This part is Part 5 of GB/T 20111.

This section was drafted in accordance with the rules given in GB/T 1.1-2009.

This part uses the redrafting method to modify and adopt IEC 61857-31.2017 ``Thermal Evaluation Regulations for Electrical Insulation System Part 31.Design

Applications with a life expectancy of 5000h and below".

The technical differences between this part and IEC 61857-31.2017 and the reasons are as follows.

---Regarding normative reference documents, this section has made adjustments with technical differences to adapt to my country's technical conditions and adjustments.

The situation is collectively reflected in Chapter 2 "Normative Reference Documents", and the specific adjustments are as follows.

* Replace IEC 61857-1 (see Chapter 3, Chapter 4, 7.1) with GB/T 20111.1 equivalent to the international standard;

* Replace IEC 61857-21 (see 6.1) with GB/T 20111.2 which is equivalent to adopting international standards;

* Replace IEC 61857-22 (see 6.1) with GB/T 20111.3 which is equivalent to adopting international standards;

* Replace IEC /T R61857-2 (see Chapter 4, Chapter 5, 6.1, 6.3) with GB/T 20111.4 modified to adopt international standards;

* Replace IEC 60505 (see Chapter 1, 6.1, 6.3) with GB/T 20112, which is equivalent to the international standard;

---The scope of application of this part has been added to the scope of Chapter 1;

--- Amend the title of Chapter 5 "Test Products" to "Test Products and Test Equipment" (see Chapter 5);

--- In 6.3, add "The high temperature point should be 10K higher than the low temperature point" in order to select the temperature corresponding to the high temperature point and the low temperature point (see 6.3).

This part was proposed by China Electrical Equipment Industry Association.

This part is under the jurisdiction of the National Standardization Technical Committee for Evaluation of Electrical Insulation Materials and Insulation Systems (SAC/TC301).

Drafting organizations of this section. Suzhou Taihu Electrical New Materials Co., Ltd., Yantai Minstar Specialty Paper Co., Ltd., Dongying Xin

Bang Electronic Technology Co., Ltd., Quality and Technical Supervision Standards and Coding Institute of Shunde District, Foshan City, Beijing Institute of Electrical Technology and Economics of Machinery Industry,

Zhejiang Rongtai Technology Enterprise Co., Ltd., Suzhou Jufeng Electrical Insulation System Co., Ltd., Sichuan Dongcai Technology Group Co., Ltd.,

Suzhou Beide Technology Co., Ltd., China Guangdong Nuclear Power Delta (Taicang) Testing Technology Co., Ltd., Shanghai Beyan Testing Service Technology Co., Ltd., China

China First Automobile Group Co., Ltd., Harbin Electric Power Equipment Co., Ltd.

Introduction

GB/T 20111.1 specifies the general requirements and methods for assessing and grading electrical insulation systems (EIS).

GB/T 20111.4 specifies guidelines for the selection of test methods for the evaluation and classification of electrical insulation systems (EIS).

This section specifies the test procedures for thermal evaluation of electrical insulation systems (EIS) with a design life of 5000h and below.

According to the application of the terminal product, a certain test procedure specified in this section can be selected.

For electrical insulation systems (EIS) with a design life of more than 5000h, thermal evaluation can be performed according to GB/T 20111.2.

Thermal assessment procedures for electrical insulation systems-Part 5.

Applications with a design life of 5000h and below

1 Scope

This part of GB/T 20111 specifies the thermal evaluation test procedure for electrical insulation systems (EIS) with a design life of 5000h and below

sequence. The test procedure follows the procedure specified in GB/T 20112, and the corresponding test procedure is selected according to the design life range.

This section applies to the thermal evaluation of electrical insulation systems with a design life of 5000h and below.

2 Normative references

The following documents are indispensable for the application of this document. For dated reference documents, only the dated version applies to this article

Pieces. For undated references, the latest version (including all amendments) applies to this document.

GB/T 20111.1 Thermal Assessment Regulations for Electrical Insulation Systems Part 1.General Requirements Low Voltage (GB/T 20111.1-2015,

IEC 61857-1.2008, IDT)

GB/T 20111.2 Thermal Assessment Regulations for Electrical Insulation Systems Part 2.Special Requirements for General Models Application of Random Winding

(GB/T 20111.2-2016, IEC 61857-21.2009, IDT)

GB/T 20111.3 Thermal Evaluation Regulations for Electrical Insulation Systems Part 3.Special Requirements for Encapsulated Coil Models

Air Insulation System (EIS) (GB/T 20111.3-2016, IEC 61857-22.2008, IDT)

GB/T 20111.4 Thermal Evaluation Regulations for Electrical Insulation Systems Part 4.Evaluation and Classification of Test Methods for Electrical Insulation Systems

Guidelines (GB/T 20111.4-2017, IEC /T R61857-2.2015, MOD)

GB/T 20112 Evaluation and identification of electrical insulation systems (GB/T 20112-2015, IEC 60505.2011, IDT)

3 Terms and definitions

The following terms and definitions defined in GB/T 20111.1 apply to this document.

3.1

Design life

Regardless of whether the work cycle is continuous or intermittent, the expected use time proposed or decided by the end user, manufacturer, etc.

3.2

Heat resistance

The highest design temperature corresponding to the design life.

3.3

Average life span

The average life span.

4 Evaluation of Electrical Insulation System (EIS)

Procedure A (see Chapter 6) is suitable for evaluating electrical insulation systems (EIS) with a design life of 1500h and below, at least higher than the maximum design

Under the condition of a temperature of 10K, a single temperature point heat aging is performed on a group of samples. The average life span of the tested sample should be at least 1500h.

Procedure B (see Chapter 6) is applicable to the evaluation of electrical insulation systems (EIS) with a design life of 5000h and below.

Under the condition of a temperature of 10K, a single temperature point heat aging is performed on a group of samples. To meet the design life of EIS, the aging time of program A

Can be extended to 5000h. The average life of this group of evaluation samples should reach at least 1500h.

Procedure C (see Chapter 6) is applicable to the evaluation of electrical insulation systems (EIS) with a design life of 5000h and below.

At the temperature of 20K~30K and 30K~35K, the two sets of samples were thermally aged at two temperature points respectively.

If additional thermal aging is started before the thermal aging specified in this part is completed, follow Procedure A, Procedure B, or Procedure described in Chapter 6.

The test results obtained in Preface C can be extended to a more complete thermal assessment based on GB/T 20111.1~GB/T 20111.4.At this time, this part

The thermal aging test can be used as a screening test for complete thermal aging. In addition, GB/T 20111.1 and GB/T 20111.4 may require hot reviews

Must include a benchmark EIS to determine the relative heat resistance (RTE). When it is necessary to extend the thermal assessment, one should be added to the assessment of other applications

Standard electrical insulation system (EIS) evaluated according to GB/T 20111.4 test method.

5 Samples and test equipment

The test product and test equipment should be determined according to the method described in GB/T 20111.4.

6 Test procedure

6.1 Procedure A (single temperature point thermal aging)---Determine the heat resistance of applications with a design life of 1500h and below

According to the procedure of the selected test method, a test cycle includes the following items.

---Comply with the thermal aging sub-cycle specified in GB/T 20112;

---Conform to the conditions specified in GB/T 20111.4 to process sub-cycles, for example, can meet GB/T 20111.2 or GB/T 20111.3

Regulations;

--- Determine the diagnostic test according to the test method selected in GB/T 20111.4.The selected aging temperature should be at least higher than the highest design

The temperature is 10K.

The average life span of the evaluated sample is at least 1500h.

To ensure that the electrical insulation system (EIS) accumulates at least 1500h of life before breakdown, the aging sub-cycle should be 168h.

Note. In fact, the aging cycle is 168h through the verification test of nine aging cycles and a cumulative life of at least 1500h.

If a set of samples is aged beyond the original test time of 1500h, the test can be terminated when the target is reached, or thermal aging can be continued.

To achieve a higher life assessment.

6.2 Procedure B (single temperature point thermal aging)---Determine the heat resistance of applications with a design life of 5000h and below

Procedure A stipulates that the aging at a single temperature point can be extended to accumulate a longer aging time, which can be extended to 5000h at most.

6.3 Procedure C (Dual temperature point thermal aging)---Determine the heat resistance of applications with a design life of 5000h and below

For the application of dual-temperature thermal aging, it is advisable to conduct cycle tests on two groups of electrical insulation systems (EIS) to be evaluated at two temperatures.

A test cycle includes the following items.

---Comply with the thermal aging sub-cycle specified in GB/T 20112;

--- Determine the diagnostic test according to the test method selected in GB/T 20111.4.The selection of temperature points can refer to the following regulations.

* The low temperature point should be 20K~30K higher than the expected maximum design temperature;

* The high temperature point should be 30K~35K higher than the expected maximum design temperature;

* The high temperature point should be 10K higher than the low temperature point.

7 Data analysis

8 Test report

The test report should include all records, relevant test information and data analysis, etc., at least including the following.

---The content of this part used;

---The process of electrical insulation system (EIS) test;

---Aging temperature and aging cycle;

---Test methods or stress levels used in the treatment of pre-diagnostic conditions and diagnostic tests of each electrical insulation system (EIS);

---The number of samples of each electrical insulation system (EIS) at each aging temperature;

---The method of obtaining the aging temperature (including the type of oven, etc.);

---If you need to specify, the air exchange rate;

---Terminal life time and failure mode of each sample;

---The logarithm average of the end-life time of each aging temperature;

---The relative heat resistance/heat class of the electrical insulation system (EIS) to be evaluated.

references