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GB/T 15651.6-2023Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

September 7, 2023

Implementation date

April 1, 2024

Scope

GB/T 15651.6-2023 (Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes) is available as an English-translated PDF.

GB/T 15651.6-2023 — This document specifies the terminology, basic ratings and characteristics, test methods and quality evaluation of light emitting diodes (LEDs) for general industrial applications.

Determined, involving annunciators, controllers, sensors, etc. This document does not cover LEDs for lighting.

LEDs are divided into the following five types. a) LED devices; b) LED flat light-emitting device; c) LED digital display and alphanumeric display; d) Dot matrix LED for display; e) Infrared emitting diode (IRLED); f) Ultraviolet emitting diode (UVLED).

This document covers LEDs with heat sinks or equivalent heat sink functions. This document does not include integral LEDs and controls, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps.

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Document preview — GB/T 15651.6-2023

National Standard of the People's Republic of China

ICS: 31.080.99
Classification: L 53

Issued by: State Administration for Market Regulation, China National Standardization Administration

Preface
Introduction
1 Scope
2 Normative reference documents
3 Terms and definitions, abbreviations
3.1 General terms and definitions
3.2 Terms and definitions related to radiation dose testing
3.3 Terms and definitions related to photometric testing
3.4 Terms and definitions related to thermal parameter testing
3.5 Abbreviations
4 Absolute maximum ratings
5 Optoelectronic properties
6 Test Method
6.1 Basic requirements
6.2 Forward voltage (VF) test
6.3 Reverse voltage (VR) test
6.4 Internal resistance (rf) test
6.5 Reverse Current (IR) Test
6.6 Inter-terminal capacitance (Ct) test
6.7 Junction temperature (Tj) and thermal resistance (Rth(jX)el, Rth(jX)real) test
6.8 Response time test
6.9 Frequency response and cutoff frequency (fc) test
6.10 Luminous flux (Phiv) test
6.11 Radiant flux (Phie) test
6.12 Luminous intensity (IV) test
6.13 Radiation intensity (Ie) test
6.14 Brightness (LV) test
6.15 Emission spectral distribution, peak emission wavelength (lambdap), spectral half-width (deltalambda) test
6.16 Chromaticity coordinate test
6.17 Directional characteristics and half intensity angle test
6.18 Illuminance (EV) test
7 Packaging marking 45
8 Quality Assessment
8.1 General
8.2 Quality Assessment Category
8.3 Appraisal and inspection
8.4 Batch-by-batch inspection
8.5 Periodic inspection
8.6 Relaxation of batch-by-batch inspection procedures 52
8.7 Maintenance of accreditation qualifications 52
8.8 Long-term storage of products 53
8.9 Electrical durability test
Appendix A (Normative) Standard optical efficiency
Appendix B (normative) Self-absorption correction factor
Appendix C (Normative) Color Correction Factor
Appendix D (normative) Calibration of luminance meter
Appendix E (Normative) Color Matching Function of XYZ Standard Colorimetric System
Appendix F (normative) Spectral chromaticity coordinates
Appendix G (normative) Light meter calibration
Reference
Figure 1 Radiation intensity
Figure 2 Radiant brightness
Figure 3 Radiation Exit Degree
Figure 4 Radiation (radiation) illumination
Figure 5 Spectral optical efficiency
Figure 6 Forward voltage VF test circuit diagram
Figure 7 Circuit diagram for testing VF using constant voltage source and current limiting resistor 17
Figure 8 Circuit diagram for testing VF with SMU17
Figure 9 VR test circuit diagram
Figure 10 RF test circuit Figure
Figure 11 IR test circuit
Figure 12 Ct test circuit diagram
Figure 13 Ct test circuit diagram
Figure 14 Example of temperature dependence of etaPE23
Figure 15 Correlation between measured thermal resistance and heating duration 24
Figure 16 Cumulative heat capacity and cumulative heat resistance characteristics (structure function)
Figure 17 VF change test circuit Figure
Figure 18 Changes in VF during the measurement process
Figure 19 Example of VF changes over time 27
Figure 20 Transient oscillation waveform after heating is turned off 27
Figure 21 Response time test circuit Figure
Figure 22 Response time test waveform
Figure 23 fc test circuit diagram
Figure 24 Phiv test circuit diagram
Figure 25 Phie test circuit diagram
Figure 26 IV test circuit schematic
Figure 27 IV test circuit diagram
Figure 28 Ie test circuit diagram
Figure 29 LV test circuit diagram
Figure 30 lambdap test circuit diagram
Figure 31 lambdap test circuit diagram
Figure 32 deltalambda test principle diagram
Figure 33 Chromaticity coordinate chart
Figure 34 Colorimetric test circuit diagram
Figure 35 Directional characteristics (Example 1)
Figure 36 Directional characteristics (example 2)
Figure 37 EV test circuit diagram
Figure 38 Electrical endurance test circuit diagram
Figure B.1 Principle of self-absorption test
Figure D.1 Principle of luminance meter calibration
Figure G.1 Illuminance meter calibration principle diagram
Table 1 Absolute Maximum Ratings 11
Table 2 Optoelectronic characteristics
Table 3 CIE average LED intensity test
Table 4 Screening test items and their conditions (reference)
Table 5 Appraisal Inspection
Table 6 Batch-by-batch inspection
Table 7 Periodic Inspection
Table A.1 Spectral light visual efficiency function V(lambda) specified value for photopic vision
Table E.1 Color matching functions of the XYZ standard colorimetric system
Table F.1 Spectral chromaticity coordinates 71

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.

This document is Part 5-6 of GB/T 15651 "Semiconductor Devices". GB/T 15651 has published the following parts.

---Semiconductor devices, discrete devices and integrated circuits Part 5: Optoelectronic devices (GB/T 15651-1995);

--- Semiconductor discrete devices and integrated circuits Part 5-2.Basic ratings and characteristics of optoelectronic devices (GB/T 15651.2-

2003);

--- Semiconductor discrete devices and integrated circuits Part 5-3.Test methods for optoelectronic devices (GB/T 15651.3-2003);

---Semiconductor Devices Discrete Devices Part 5-4.Optoelectronic Devices Semiconductor Lasers (GB/T 15651.4-2017);

This document is equivalent to IEC 60747-5-6:2021 "Semiconductor Devices Part 5-6.Optoelectronic Devices Light-Emitting Diodes".

This document has made the following minimal editorial changes.

---Add footnotes g and h in Table 1, footnote 1 in Table 2, footnote j in Table 5, footnote m in Table 6, and footnote f in Table 7.

Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents.

Introduction

Parts 5-6 of the GB/T 15651 series are formulated to provide appropriate testing and evaluation of light-emitting diode products for general industrial applications.

basis.

Part 5 of the GB/T 15651 series is a series of standards for semiconductor optoelectronic devices, which mainly stipulates the overall requirements for optoelectronic devices.

Requirements, basic ratings and characteristics, test methods, semiconductor lasers, optocouplers, light emitting diodes, photodiodes and phototransistors, etc.

The technical requirements, quality assurance regulations and other contents of the device are planned to be composed of the following parts.

---Part 5: Optoelectronic devices. The purpose is to provide semiconductor light emitting devices, semiconductor photodetection devices, semiconductor photosensitive Standards for semiconductor devices and classified devices related to components, internal working mechanisms and optical radiation.

---Part 5-2.Basic ratings and characteristics of optoelectronic devices. The purpose is to provide semiconductor optoelectronic emitting devices, semiconductor Photodetector devices, semiconductor photosensitive devices, semiconductor devices that perform optical radiation work internally, and basic devices classified as optoelectronic devices these ratings and characteristics are not applicable to fiber optic systems or subsystems.

---Part 5-3.Optoelectronic device testing methods. The purpose is to provide testing methods for optoelectronic devices for fiber optic systems or Except for subsystems.

---Part 5-4.Optoelectronic devices semiconductor lasers. The purpose is to specify the basic ratings, characteristics and Test Methods.

---Part 5-5.Optoelectronic devices optocoupler. The purpose is to define the terminology, basic ratings, characteristics, Safety testing and measurement methods.

---Part 5-6.Optoelectronic devices light-emitting diodes. The purpose is to specify the terminology, ratings and characteristics, testing and testing of light-emitting diodes.

test methods and quality assessment methods.

---Part 5-7.Optoelectronic devices photodiodes and phototransistors. The purpose is to specify photodiodes and photocrystals Pipe terminology, basic ratings and characteristics, and methods of measurement.

Semiconductor Devices Part 5-6.

Optoelectronic devices light emitting diodes

1 Scope

This document specifies the terminology, basic ratings and characteristics, test methods and quality evaluation of light emitting diodes (LEDs) for general industrial applications.

Determined, involving annunciators, controllers, sensors, etc.

This document does not cover LEDs for lighting.

LEDs are divided into the following five types.

a) LED devices;

b) LED flat light-emitting device;

c) LED digital display and alphanumeric display;

d) Dot matrix LED for display;

e) Infrared emitting diode (IRLED);

f) Ultraviolet emitting diode (UVLED).

This document covers LEDs with heat sinks or equivalent heat sink functions.

This document does not include integral LEDs and controls, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps.

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations for undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.

ISO 2859-1 Enumeration sampling inspection procedures Part 1: Lot-by-lot inspection sampling plan retrieved by acceptance quality limit (AQL) Sam-limit(AQL)forlot-by-lotinspection) Note. GB/T 2828.1-2012 Enumeration sampling inspection procedures Part 1: Batch-by-batch inspection sampling plan (ISO 2859-1:1999,IDT) tingprocedures-Part 2-17.Tests-TestQ.Sealing) IEC 60068-2-30 Environmental testing Part 2-30.Test method test Db alternating damp heat, cycle (12h 12h cycle) IEC 60747-5-13 Semiconductor devices Part 5-13.Hydrogen sulfide corrosion test for LED packages of optoelectronic devices (Semicon-IEC 60749-10 Mechanical and climatic test methods for semiconductor devices Part 10: Mechanical shock (Semiconductor

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 79 pages — is available in the English PDF.

Referenced standards

Cited by

GB/T 15651.13-2026Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

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