Obsolete

GB 1553-1979Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods (English PDF)

硅单晶寿命直流光电导衰退测量方法

GB 1553 | Evolution and historical versions

Std ID	Title	Status
GB/T 1553-1997	Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay	Obsolete
GB 1553-1979	Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods	Obsolete

GB 1553-1979 is obsolete. It has been replaced by GB/T 1553-1997. This page sells the obsolete edition, for projects and contracts that still cite it.

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Level / Type

National · Mandatory

Scope

GB 1553-1979 is the English-translated version of 硅单晶寿命直流光电导衰退测量方法.

GB 1553-1979 is the Chinese national standard "Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods". It is obsolete: it has been replaced by GB/T 1553-1997.

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Document preview — GB 1553-1979

Document data

1 Document data

Sector: National standard (Mandatory).

Status: obsolete, replaced by GB/T 1553-1997.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.

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