EJ/T 1204.1-2006Determination of the detection limit and decision threshold for ionizing radiation measurements - Part 1: Counting measurements without the influence of sample treatment (English PDF)
电离辐射测量探测限和判断阈的确定 第1部分：忽略样品处理影响的计数测量
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Issued by
Commission of Science, Technology and Industry for National Defense
Level / Type
National · Recommended
Issue date
December 15, 2006
Implementation date
May 1, 2007
Scope
EJ/T 1204.1-2006 is the English-translated version of 电离辐射测量探测限和判断阈的确定 第1部分：忽略样品处理影响的计数测量.
EJ/T 1204.1-2006 is the Chinese industry standard "Determination of the detection limit and decision threshold for ionizing radiation measurements - Part 1: Counting measurements without the influence of sample treatment".
It was issued on December 15, 2006 by the Commission of Science, Technology and Industry for National Defense, and took effect on May 1, 2007. It is in force.
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Document preview — EJ/T 1204.1-2006
National Standard of the People's Republic of China
Issued by: Commission of Science, Technology and Industry for National Defense
Contents
- Document data
1 Document data
Sector: Nuclear (industry standard).
Issuing body: Commission of Science, Technology and Industry for National Defense.
Date of issue: 2006-12-15.
Date of implementation: 2007-05-01.
Status: valid.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
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Related Standards
EJ/T 1204.2-2006 — Determination of the detection limit and decision threshold for ionizing radiation measurements - Part 2: Counting measurements with the influence of sample treatment taken into account
EJ/T 1204.3-2006 — Determination of the detection limit and decision threshold for ionizing radiation measurements - Part 3: Counting measurements by high resolution gamma spectrometry, neglecting the influence of sample treatment
EJ/T 1204.4-2006 — Determination of the detection limit and decision threshold for ionizing radiation measurements - Part 4: Measurements with linear-scale analogue ratemeters neglecting the influence of sample treatment
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